The influence of schlieren on in situ optical measurements used for particle characterization [Sequoia, July 7, 2008] Mikkelsen OA, Milligan TG, Hill PS, Chant RJ, Jago CF, Jones SE, Krivtsov V, Mitchelson-Jacob G (2008): The influence...
Light scattering by random shaped particles and consequences on measuring suspended sediments by laser diffraction by Agrawal YC, Whitmire A, Mikkelsen OA, Pottsmith HC (2008): Light scattering by random shaped particles and consequences on measuring...
How LISST instruments measure the size distribution and concentration of particles [Sequoia Scientific, April 18, 2008; article identical to Application Note L001 Rev. 10/2006] LISST instruments represent a new generation of systems...
The size resolution of the LISST series of instruments [Sequoia, April18, 2008; this article is identical to Application Note L008] The LISST instruments observe the multi-angle scattering of light from an ensemble of particles in...
Calibrating the LISST series instruments [Sequoia, April18, 2008; this article is identical to Application Note L009] The LISST series of instruments measure particle size distribution, i.e. the volume fraction contained in each of...