News
July 7, 2008
Light scattering by random shaped particles and consequences on measuring suspended sediments by laser diffraction by Agrawal YC, Whitmire A, Mikkelsen OA, Pottsmith HC (2008): Light scattering by random shaped particles and consequences on measuring...
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July 7, 2008
The influence of schlieren on in situ optical measurements used for particle characterization
[Sequoia, July 7, 2008]
Mikkelsen OA, Milligan TG, Hill PS, Chant RJ, Jago CF, Jones SE, Krivtsov V, Mitchelson-Jacob G (2008): The influence...
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April 18, 2008
How LISST instruments measure the size distribution and concentration of particles
[Sequoia Scientific, April 18, 2008; article identical to Application Note L001 Rev. 10/2006]
LISST instruments represent a new generation of systems...
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April 18, 2008
The size resolution of the LISST series of instruments
[Sequoia, April18, 2008; this article is identical to Application Note L008]
The LISST instruments observe the multi-angle scattering of light from an ensemble of particles in...
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April 18, 2008
Calibrating the LISST series instruments
[Sequoia, April18, 2008; this article is identical to Application Note L009]
The LISST series of instruments measure particle size distribution, i.e. the volume fraction contained in each of...
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