The influence of schlieren on in situ optical measurements used for particle characterization [Sequoia, July 7, 2008] Mikkelsen OA, Milligan TG, Hill PS, Chant RJ, Jago CF, Jones SE, Krivtsov V, Mitchelson-Jacob G (2008): The influence...
How LISST instruments measure the size distribution and concentration of particles [Sequoia Scientific, April 18, 2008; article identical to Application Note L001 Rev. 10/2006] LISST instruments represent a new generation of systems...
Calibrating the LISST series instruments [Sequoia, April18, 2008; this article is identical to Application Note L009] The LISST series of instruments measure particle size distribution, i.e. the volume fraction contained in each of...