The LISST-2OOX For Profiling Applications
The LISST-200X can be used in profiling applications, check out the specifics in this video! https://www.sequoiasci.com/wp-content/uploads/2020/09/LISST-200X_V5.mp4
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Lecture: The Influence of Schlieren on In-situ Optical Measurements Used for Particle Characterization
In 2008, Sequoia Scientific’s Dr. Ole Mikkelsen co-authored and published a paper: The Influence of Schlieren on In-situ Optical Measurements Used for Particle Characterization. This paper was based on data collected during his postdoctoral work...
LISST-200X Path Reduction Module (PRM)
Sequoia’s LISST-200X has been designed to cover a wide range of particle concentrations. However, at high concentrations the light scattering from the particles can include multiple scattering. This will affect the measurement of particle size and...
On the Feasibility of Measuring Plastic Particles in Situ
As reports over the last 3-4 decades demonstrate increasing plastic concentration in the oceans, public and regulatory concerns have grown in parallel. Sequoia Scientific Inc. and other instrument manufactures are thus frequently contacted by scientists...
Laser Diffraction Principles
This is a simple description. For detailed explanations see articles: Laser Diffraction-101 and -201. Particle Size Distribution (PSD) is a multi-parameter description of how the total concentration of particles is distributed into many size fractions....