Particle Size Analyzers > LISST-25X
| LISST-25X | | | | |







LISST-25 marks a generational advancement in the measurement of suspended sediments. Unlike all prior sediment sensors, optical or acoustic, the LISST-25X maintains its calibration over a 200:1 range of particle sizes.  This is the only sensor capable of holding calibration for sediment concentration regardless of particle color or size within this broad a range.

The idea behind the LISST-25X is to use shaped focal plane detectors. These detectors (see figure) derive their shape from the physics of light scattering. The shape is found such that for any size of particle in the 2.5 to 500 micron range, the instrument reports the correct volume concentration. A different shape is found to yield area concentration. The ratio of volume to area is called the Sauter Mean Diameter. The instrument employs 2 paris of shaped detectors. One pair measures particles in the 2.5 to 63 micron range, the other in the 63-500 micron range. An anti-fouling accessory BioBlock is also available for this instrument.

The instrument is self-contained, with memory and batteries. It is fully programmable to set sample rate. Data can be internally stored or captured in real time.  A depth sensor is included as standard.
Software for data offload and display is provided.



The LISST-25A is discontinued since July 2005.

This instrument was the original version. It has been superseded by the more powerful LISST-25X described above.




Related Links
Technical Documents
>Technical Specifications for the LISST-25



LISST-WING
Sequoia announces the availability of the airborne cloud droplet sensor based on laser diffraction technology. Key features: a large swept volume (90 l/s at 60 knots airspeed), no need for velocity data, and up to 16Hz recording of the size distribution. For more information, contact us.
Chinese LISST users workshop
Qingdao, China, 10-12 November 2008

Colorado River Basin Science and Resource Management Symposium
Scottsdale, AZ, 18-20 November 2008

AGU Fall Meeting
San Francisco, CA, 16-19 December 2008
   

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